Blank Cover Image

Testing method for CDs

Author(s):
  • Zhang,Y. ( Tsinghua Univ.(China) )
  • Lu,Y. ( Tsinghua Univ.(China) )
  • Xu,D. ( Tsinghua Univ.(China) )
  • Pan,L. ( Tsinghua Univ.(China) )
Publication title:
Optical storage technology : 16-18 September, 1998, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3562
Pub. Year:
1998
Page(from):
130
Page(to):
134
Pub. info.:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430236 [0819430234]
Language:
English
Call no.:
P63600/3562
Type:
Conference Proceedings

Similar Items:

Zhang,Y., Xu,D., Pan,L.

SPIE - The International Society for Optical Engineering

Zhang,H., Xu,D., Pan,L.

SPIE-The International Society for Optical Engineering

Z. Pan, L. Cheng, G. Zhang

Society of Photo-optical Instrumentation Engineers

Li,H., Lu,D., Xu,D., Pan,L.

SPIE-The International Society for Optical Engineering

3 Conference Proceedings Writing and reading method

Ma,L., Xu,D., Pan,L.

SPIE-The International Society for Optical Engineering

9 Conference Proceedings Developed player for multilayer disk

Huang,G., Xu,D., Pan,L., Lu,D., Qi,G.

SPIE-The International Society for Optical Engineering

Zhang,Z., Pan,L., Ma,L., Xu,D.

SPIE-The International Society for Optical Engineering

X. Pan, Y. Lu, X. Xu, H. Zhang

Society of Photo-optical Instrumentation Engineers

Zhang,H., Xu,D., Pan,L.

SPIE-The International Society for Optical Engineering

Meng,D., Pan,L., Ma,L., Ji,K., Xu,D.

SPIE-The International Society for Optical Engineering

Zhang,H., Pan,L., Xu,D.

SPIE-The International Society for Optical Engineering

Yang,J., Pan,L., Lu,Z., Lu,Y., Zeng,H., Chen,J., Ma,L., Xu,D.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12