Characterization of Kapton Polyimide Films by Using X-ray and Optical Techniques

Characterization of Kapton Polyimide Films by Using X-ray and Optical Techniques

Author(s):

Cha C. ( Georgia Institute of Technology )
Samuels J. R.

Publication title:

ANTEC 93 : Be in that number : conference proceedings : New Orleans, May 9-13, 1993

Title of ser.:

Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers

Ser. no.:

39

Pub. Year:

1993

Vol.:

1

Page(from):

2896

Page(to):

2899

Pages:

4

Pub. info.:

Brookfield Center, CT: Society of Plastics Engineers, Inc. (SPE)

Language:

English

Call no.:

S42700/932082

Type:

Conference Proceedings

Details

TDL ID:	ZA00018300
Series ID:	PA00000030
Conf. info. (Name):	ANTEC '93 : Annual Technical Conference
Conf. info. (Number):	51st
Conf. info. (Venue):	New Orleans, LA, USA
Conf. info. (Date):	1993.05.09-1993.05.13
Note for article:	PLASTICS ALANYSIS DIVISION

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