Blank Cover Image

Patterning of Liquid Crystal Waveguides with the Scanning Force Microscope

Author(s):
Publication title:
Photons and local probes
Title of ser.:
NATO ASI series. Series E, Applied sciences
Ser. no.:
300
Pub. Year:
1995
Page(from):
319
Page(to):
324
Pages:
6
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792337096 [0792337093]
Language:
English
Call no.:
N11482/300
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings A Scanning Force and Friction Microscope

Niedermann Ph., Burger J., Binggeli M., Christoph R., Hintermann E. H., Marti O.

Kluwer Academic Publishers
7 Conference Proceedings Combined interference and scanning force microscope

Danzebrink, H. U., Tyrrell, J. W. G., Dal Savio, C., Kruger-Sehm, R.

SPIE - The International Society of Optical Engineering
2 Conference Proceedings Scanning Near-Field Optical Microscopes for High Resolution Imaging

Lacoste, Huser, Heinzelmann H., Guntherodt -J. H.

Kluwer Academic Publishers
8 Conference Proceedings NEW PREPARATION METHOD FOR LIQUID ALLOY SURFACES AND THEIR CHARACTERIZATION BY ELECTRON SPECTROSCOPY

Indlekofer, G., Oelhafen, P., Guntherodt, H. -J.

Materials Research Society
3 Conference Proceedings Applications of Magnetic Force Microscopy

Grutter P.

Kluwer Academic Publishers
9 Conference Proceedings ATOMIC FORCE MICROSCOPE DESIGNS AND APPLICATIONS

Bryant, P.J., Miller, R.G., Deeken, R.H., Pederson, M.A.

Materials Research Society
4 Conference Proceedings Probing field distributions on waveguide structures with an atomic force/photon scanning tunneling microscope

E.G. Borgonjen, M.H.P. Moers, A.G.T. Ruiter, N.F. van Hulst

Society of Photo-optical Instrumentation Engineers
10 Conference Proceedings Patterned alignment of liquid crystals

Varghese, S., Narayanankutty, S., Bastiaansen, C.W.M., Crawford, G.P., Broer, D.J.

SPIE - The International Society of Optical Engineering
5 Conference Proceedings "Combined Photon Scanning Tunneling Microscope and Atomic Force Microscope using Silicon Nitrde Tips"

Moers P. H. M., Tack G. R., Noordman J. F. O., Segerink B. F., van Hulst F. N., Bolger B.

Kluwer Academic Publishers
11 Conference Proceedings Resolution limits of force microscopy

Luthi, R., Meyer, E., Bammerlin, M., Baratoff, A., Lu, J., Guggisberg, M., Guntherodt, H.-J.

American Chemical Society
6 Conference Proceedings Electrons and Ions in Liquid and Amorphous Metals

Guntherodt -J. H.

D. Reidel
12 Conference Proceedings Force Microscopy

Heinzelmann. H, Meyer. E, Rudin. H, Guntherodt. J. H

Kluwer Academic Publishers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12