Multiresolution spline warping for EPI registration

Author(s):

• Kybic,J. ( Swiss Federal Institute of Technology )
• Thevenaz,P.
• Unser,M.A.

Publication title:

Wavelet applications in signal and image processing VII : 19-23 July 1999, Denver, Colorado

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3813

Pub. Year:

1999

Page(from):

571

Page(to):

579

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819432995 [0819432997]

Language:

English

Call no.:

P63600/3813

Type:

Conference Proceedings