Measurement of GaAs/(Al,Ga)As materials parameters for QWIP design calculations

Measurement of GaAs/(Al,Ga)As materials parameters for QWIP design calculations

Author(s):

Leavitt,R.P. ( Army Research Lab. )
Beekman,D.W.
Little,J.W.

Publication title:

Infrared technology and applications XXV : 5-9 April 1999, Orlando, Florida

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3698

Pub. Year:

1999

Page(from):

668

Page(to):

674

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819431721 [0819431729]

Language:

English

Call no.:

P63600/3698

Type:

Conference Proceedings

Details

TDL ID:	ZA00018084
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Infrared technology and applications
Conf. info. (Number):	1999 : 25th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	1999.04.05-1999.04.09

Similar Items:

1 Conference Proceedings Temperature Dependence of the Responsivity of QWIPs Goldberg, A.C., Little, J.W., Kennerly, S.W., Beckman, D.W., Leavitt, R.P. Electrochemical Society	7 Conference Proceedings C-QWIP material design and growth K. K. Choi, J. W. Devitt, D. P. Forrai, D. Endres, J. Marquis, J. Bettge, P. Pinsukanjana SPIE - The International Society of Optical Engineering
2 Conference Proceedings Device physics and focal plane array applications of QWIP and MCT Tidrow,M.Z., Beck,W.A., Clark,W.W., Pollehn,H.K., Little,J.W., Dhar,N.K., Leavitt,R.P., Kennerly,S.W., Beekman,D.W., … SPIE - The International Society for Optical Engineering	8 Conference Proceedings Simplified QWIPs for low-temperature and low-background applications Tidrow,M.Z., Beekman,D.W., Kennerly,S.W., Jiang,X., Li,S.S., Singh,A., Dodd,M.A. SPIE-The International Society for Optical Engineering
3 Conference Proceedings Growth and Characterization of InAs and InSb Quantum Dot Superlattices in Ternary Alloy Matrices: Toward an Optimized Strain-Balanced Quantum Dot Detector * Leavitt, R.P., Little, J.W. Electrochemical Society	9 Conference Proceedings Measurement of the Hall Scattering Factor in 4H SiC Epilayers from 40K to 290K and up to Magnetic Fields of Nine Tesla Rutsch,G., Devaty,R.P., Langer,D.W., Rowland,L.B., Choyke,W.J. Trans Tech Publications
4 Conference Proceedings New advanced two-color (MW/LW) infrared detector and focal plane array design using InGaAs/InAlAs quantum well infrared photodetectors on InP substrates Kennerly,S.W., Little,J.W., Goldberg,A.C., Leavitt,R.P. SPIE-The International Society for Optical Engineering	10 Conference Proceedings Risk convolution calculations Beekman A. J. D. Reidel
5 Conference Proceedings Quantum well infrared photodetector performance parameters vs.binding energy Beekman,D.W., Little,J.W., Kennerly,S.W., Goldberg,A.C. SPIE-The International Society for Optical Engineering	11 Conference Proceedings Comparison of HgCdTe and QWIP dual-band focal plane arrays Goldberg,A.C., Kennerly,S.W., Little,J.W., Pollehn,H.K., Shafer,T.A., Mears,C.L., Schaake,H.F., Winn,M.L., Taylor,M.F., … SPIE-The International Society for Optical Engineering
6 Conference Proceedings Polarization-sensitive QWIP thermal imager Beekman,D.W., Anda,J.B.Van SPIE - The International Society for Optical Engineering	12 Conference Proceedings Thin Film Optical Materials for Use in Microtechnology P.M. Martin, D.W. Matson, W.D. Bennett, J.W. Johnston Society of Vacuum Coaters

1

2

3

4

5

6

7

8

9

10

11

12