Measurement of scatter from PSL standard spheres deposited on disk surfaces
- Author(s):
- Scheer,C.A. ( ADE Optical Systems )
- Stover,J.C.
- Publication title:
- Surface characterization for computer disks, wafers, and flat panel displays : 28 January 1999, San Jose, California
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3619
- Pub. Year:
- 1999
- Page(from):
- 72
- Page(to):
- 79
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819430892 [0819430897]
- Language:
- English
- Call no.:
- P63600/3619
- Type:
- Conference Proceedings
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