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EEV CCD39 wavefront sensor cameras for AO and interferometry

Author(s):
DuVarney,R.C. ( SciMeasure Analytical Systems,Inc.(USA)and Emory Univ. )
Bleau,C.A.
Motter,G.T.
Shaklan,S.B.
Kuhnert,A.C.
Brack,G.
Palmer,D.
Troy,M.
Kieu,T.
Dekany,R.G.
5 more
Publication title:
Adaptive optical systems technology : 29-31 March, 2000, Munich, Germany
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4007
Pub. Year:
2000
Vol.:
Part1
Page(from):
481
Page(to):
492
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436320 [0819436321]
Language:
English
Call no.:
P63600/4007
Type:
Conference Proceedings

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