Optimization of PHS-based chemically amplified negative resist for 100-kV electron-beam projection lithography(EPL)
- Author(s):
Miyasaka,M. ( NEC Corp. ) Tokunaga,K. Koba,F. Yamashita,H. Nakajima,K. Nozue,H. - Publication title:
- Emerging lithographic technologies IV : 28 February-1 March 2000, Santa Clara, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3997
- Pub. Year:
- 2000
- Page(from):
- 344
- Page(to):
- 351
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819436153 [0819436151]
- Language:
- English
- Call no.:
- P63600/3997
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Development of data conversion system for electron-beam projection lithography (EPL) mask
SPIE-The International Society for Optical Engineering |
7
Conference Proceedings
Supercritical resist dry technique for electron-beam projection lithography (EPL)
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
8
Conference Proceedings
One-dimensional calculation method for proximity effect correction in cell projection electron-beam direct writing
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
Chemically amplified resists for electron-beam projection lithography mask fabrication
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
10
Conference Proceedings
Profile characteristics and simulation of chemically amplified resists in electron-beam lithography
SPIE-The International Society for Optical Engineering |
5
Conference Proceedings
0.15-ヲフm pattern formation using cell projection electron-beam direct writing with variable shot size
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Chemically amplified deep UV resists for electron-beam lithography applications
SPIE-The International Society for Optical Engineering |
6
Conference Proceedings
Highly accurate stitching method between cell projection and variably shaped e-beam shots
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |