DQE(f)of an amorphous-silicon flat-panel x-ray detector:detector paramete influences and measurement methodology

DQE(f)of an amorphous-silicon flat-panel x-ray detector:detector paramete influences and measurement methodology

Author(s):

Granfors,P.R. ( GE Medical Systems )
Aufrichtig,R.

Publication title:

Medical Imaging 2000: Physics of Medical Imaging

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3977

Pub. Year:

2000

Page(from):

2

Page(to):

13

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819435941 [0819435945]

Language:

English

Call no.:

P63600/3977

Type:

Conference Proceedings

Details

TDL ID:	ZA00018053
Series ID:	PA00000029
Conf. info. (Name):	Medical Imaging
Conf. info. (Number):	2000
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2000.02.13-2000.02.15

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