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The critical stress for transmission of a dislocation across an interface: Results from peierls and embedded atom models

Author(s):
Publication title:
Interfacial engineering for optimized properties II : symposium held December 1-2, 1999, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
586
Pub. Year:
2000
Page(from):
267
Pub. info.:
Warrendale, Pa.: MRS-Materials Research Society
ISSN:
02729172
ISBN:
9781558994942 [1558994947]
Language:
English
Call no.:
M23500/586
Type:
Conference Proceedings

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