Aluja R. M., Liedo F. P.
Springer-Verlag
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Robertson, D., Niewczas, P., McDonald, J. R.
SPIE - The International Society of Optical Engineering
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Teranishi, R., Buttery, R. G., Matsumoto, K. E., Stern, D. J., Cunningham, R. T., Gothilf, S.
American Chemical Society
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Grierson D., Smith S. J. C., Morris C. P., Watson C., Bird R. C., Ray J., Schuch W., Knapp E. J., Davies K., Picton J. …
Springer-Verlag
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Wood J. R.
Springer-Verlag
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Katz, E., Galili, D., Weiss, D., Riov, J., Goldschmidt, E.E.
IOS Press
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Rodrigo, M.J., Zacarias, L.
IOS Press
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Garcia, R., Sales, S., Capmany, J., Warzanskyj, W., McDonald, D., Bastiani, M.
SPIE - The International Society of Optical Engineering
|
RUSLI, I. T., SHAW, K. P., TANKE, M. A., CLAYTON, W. R.
American Institute of Chemical Engineers
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Bouchard,J.-P., Janz,S., Xu,D.-X., Wasilewski,Z.R., Akano,U.G., Mitchell,I.V., Piva,P.G., Tetu,M.
SPIE-The International Society for Optical Engineering
|
Walraven,J.A., Soden,J.M., Tanner,D.M., Tangyunyong,P., Cole Jr.,E.I., Anderson,R.E., Irwin,L.W.
SPIE-The International Society for Optical Engineering
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W. Pintjens, D. H. J. Poot, M. Verhoye, A. Van Der Linden, J. Sijbers
Society of Photo-optical Instrumentation Engineers
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