Blank Cover Image

ELECTRONIC PROPERTIES OF InP(100)-(1x1)-S SURFACE

Author(s):
Publication title:
Surface chemical cleaning and passivation for semiconductor processing
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
315
Pub. Year:
1993
Page(from):
151
Pub. info.:
Pittsburgh, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992139 [1558992138]
Language:
English
Call no.:
M23500/315
Type:
Conference Proceedings

Similar Items:

Lu, Z.H., Tao, Y., Yang, B.X., Feng, X.H., Mitchell, D.F., Yelon, A., Graham, M.J., Sacher, E.

Materials Research Society

Sacher, J., Knispel, R., Stry, S.

SPIE - The International Society of Optical Engineering

Tao, Y., Yelon, A., Sacher, E., Lu, Z.H., Graham, M.J.

Materials Research Society

J. Szarko, L. Socaciu-Siebert, A. Neubauer, T. Hannappel, R. Eichberger

Society of Photo-optical Instrumentation Engineers

Arsenault, L.-F., Lebib, S., Sacher, E., Yelon, A.

Materials Research Society

R.A. Masut, C.A. Tran, M. Beaudoin, R. Leonelli

Society of Photo-optical Instrumentation Engineers

S. Stry, J. R. Sacher

SPIE - The International Society of Optical Engineering

Visbeck, S., Hannappel, T., Vogt, P., Mahrt, J., Zorn, M., Knorr, K., Neges, M., Esser, N., Richter, W., Willig, F.

MRS - Materials Research Society

Beaudoin, M., Masut, R. A., Isnard, L., Desjardins, P., Bensaada, A., L'Esperance, G., Leonelli, R.

MRS - Materials Research Society

Bai, G., Nicolet, M-A., Kim, S.-J., Sobers, R.G., Lee, J.W., Brelvi, M., Thomas, P.M., Wilt, D.P.

Materials Research Society

Branz, H. M., Masson, D. P., Sacher, E., Sheng, S., Yelon, A.

Materials Research Society

Wu, C. S., Lau, S. S., Kuech, T. F., Liu, B. X.

North-Holland

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12