Blank Cover Image

Computer Simulation of Channeling Profile Analysis of Implantation Damage

Author(s):
Posselt, Matthias  
Publication title:
Silicon front-end technology--materials processing and modelling, symposium held April 13-15, 1998, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
532
Pub. Year:
1998
Page(from):
133
Pub. info.:
Warrendale, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994386 [1558994386]
Language:
English
Call no.:
M23500/532
Type:
Conference Proceedings

Similar Items:

Posselt, Matthias

Materials Research Society

Posselt, M., Schmidt, B., Murthy, C.S., Feudel, T.

Electrochemical Society

Posselt, Matthias

MRS - Materials Research Society

Ber, B.J., Kovarsy, A.P., Schmidt, A.A., Trushin, Y.V., Zhurkin, E.E., Krusenstern, F.A.

SPIE-The International Society for Optical Engineering

Zolnai, Z., Ster, A., Khanh, N. Q., Kotai, E., Posselt, M., Battistig, G., Lohner, T., Gyulai, J.

Trans Tech Publications

Gao, F., Weber, W.J., Posselt, M., Belko, V.

Trans Tech Publications

10 Conference Proceedings Damage Profiles in Ion Implanted Silicon

Hara, Tohru, Muraki, Takeshi, Sakurai, Masataka, Takeda, Satoru

Electrochemical Society

Schmidt, Bruno, Posselt, Matthias, Strecker, Norbert, Feudel, Thomas

MRS - Materials Research Society

Yang, Shyh-Horng, Lim, David, Morris, Steven J., Tasch, Al F.

MRS - Materials Research Society

Curello, Giuseppe, Rengarajan, Rajesh, Faul, Juergen, Wurzer, Hehnut, Amon, Juergen, Gaertner, Thomas, Henke, Diettmar, …

Materials Research Society

Stoffel, N. G, Hart, D. L.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12