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Atomistic Modelling of Point and Extended Defects in Crystalline Materials

Author(s):
Jaraiz, Martin
Pelaz, Lourdes
Rubio, Emiliano
Barbolla, Juan
Gilmer, George H.
Eaglesham, David J.
Gossmann, Hans J.
Poate, John M.
3 more
Publication title:
Silicon front-end technology--materials processing and modelling, symposium held April 13-15, 1998, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
532
Pub. Year:
1998
Page(from):
43
Pub. info.:
Warrendale, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994386 [1558994386]
Language:
English
Call no.:
M23500/532
Type:
Conference Proceedings

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