Blank Cover Image

The Estimation and Revision of Barrier Heights in 4H-SiC and 6H-SiC Schottky Diodes

Author(s):
Publication title:
Wide-bandgap semiconductors for high power, high frequency, and high temperature : symposium held April 13-15, 1998, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
512
Pub. Year:
1998
Page(from):
175
Pub. info.:
Warrendale, Penn.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994188 [1558994181]
Language:
English
Call no.:
M23500/512
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings The Temperature Dependent Breakdown Voltage For 4H- and 6H-SiC Diodes

Lee, You-Sang, Han, M.K., Choi, Y.I.

Materials Research Society
7 Conference Proceedings 1 /f noise of GaAs Schottky diodes embedded with self-assembled InAs quantum dots

Song, J. D., Choi, W. J., Han, I. K., Cho, W. J., Lee, J. I., Yu, Y. B., Pyun, C. H., Kim, J. H., Song, J. I., Chovet, …

SPIE - The International Society of Optical Engineering
2 Conference Proceedings Improvements in the Reverse Characteristics of 4H-SiC Schottky Barrier Diodes by Hydrogen Treatments

Kim, D.H., Na, H.J., Jung, S.Y., Song, I.B., Um, M.Y., Song, H.K., Jeong, J.K., Lee, J.B., Kim, H.J.

Trans Tech Publications
8 Conference Proceedings Schottky Barrier Diode Fabricated by MOCVD-Grown Epilayer Using Bis- Trimethylsilylmethane Precursor

H.K. Song, J.H. Lee, M.S. Oh, J.H. Moon, H.S. Seo

Trans Tech Publications
3 Conference Proceedings The Closed-Form Solutions for the Breakdown Voltages of 6H-SiC Reachthrough Diodes

Lee, You-Sang, Byeon, D-S., Choi, Y-I., Park, I-Y., Han, Min-Koo

MRS - Materials Research Society
9 Conference Proceedings Effect of Plasma Etching and Sacrificial Oxidation on 4H-SiC Schottky Barrier Diodes

Morrison, D. J., Pidduck, A. J., Moore, V., Wilding, P. J., Hilton, K. P., Uren, M. J., Johnson, C. M.

Trans Tech Publications
4 Conference Proceedings Study of 4H-SiC Junction Barrier Schottky(JBS) Diode Using Various Junction Structures

K.H. Kim, Y.H. Kang, J.H. Lee, E.S. Jung, I.H. Kang

Trans Tech Publications
10 Conference Proceedings Impact of Interface Traps on Current-Voltage Characteristics of 4H-SiC Schottky-Barrier Diodes

H. Amini Moghadam, S. Dimitrijev, J.S. Han

Trans Tech Publications
5 Conference Proceedings Junction Barrier Schottky Diodes in 4H-SiC and 6H-SiC

Dahlquist,F., Zetterling,C.-M., Ostling,M., Rottner,K.

Trans Tech Publications
11 Conference Proceedings Barrier Inhomogeneities of Mo Schottky Barrier Diodes on 4H-SiC

M. Naretto, D. Perrone, S. Ferrero, L. Scaltrito

Trans Tech Publications
6 Conference Proceedings Impact of Stacking Fault on the I-V Characteristics of 4H-SiC Schottky Barrier Diode

H.J. Jung, S.B. Yun, I.H. Kang, J.H. Moon, W.J. Kim

Trans Tech Publications
12 Conference Proceedings Effects of Microstructure and Environment on Fatigue Properties of Investment Cast Ti-6Al-4V Alloy Welds

Lee, H., Choi, J. W., Oh, J. K., Kim, N. J.

Trans Tech Publications
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12