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Direct Observation of Atomic Structures of Defects in GaN by High-Resolution Z-Contrast STEM

Author(s):
Xin, Y.
Pennycook, S. J.
Browing, N. D.
Nellist, P. D.
Sivanathan, S.
Beaumont, B.
Faurie, J-P.
Gibart, P.
3 more
Publication title:
Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
482
Pub. Year:
1998
Page(from):
781
Pub. info.:
Warrendale, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993877 [1558993878]
Language:
English
Call no.:
M23500/482
Type:
Conference Proceedings

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