Blank Cover Image

Microstructure and OptoElectronic Properties of CdSe Thin Films

Author(s):
Publication title:
Polycrystalline thin films : structure, texture, properties and applications III : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
472
Pub. Year:
1997
Page(from):
131
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993761 [1558993762]
Language:
English
Call no.:
M23500/472
Type:
Conference Proceedings

Similar Items:

Klement, U., Horst, D., Ernst, F.

MRS - Materials Research Society

Mahmoud,S.A., Ashour,A., Badawi,E.A.

SPIE - The International Society for Optical Engineering

F. Flory

Society of Photo-optical Instrumentation Engineers

Luo, F.-C.

North Holland

Stoenescu,G.

SPIE - The International Society for Optical Engineering

Graettinger, Thomas M., Morris, P. A., Woolcott, R. R., Zumsteg, F. C., Chow, A. F., Kingon, A. I.

MRS - Materials Research Society

Elango,T., Subramanian,V., Venkatasubramanian,S., Murali,K.R.

SPIE-The International Society for Optical Engineering

Sharma, R.P., Raghuvanshi, M.S., Chavhan, S.D., Bhavsar, G.P., Bhavsar, S.V., Patil, A.R., Dori, L.

SPIE-The International Society for Optical Engineering

A. A. Chistyakov, S. V. Daineko, A. O. Helmut, V. A. OIeinikov, M. G. Tedoradze

Society of Photo-optical Instrumentation Engineers

J.P. Cui, L. Zhong, X.F. Bi

Trans Tech Publications

Misra, S.C.K., Cruickshank, F.R., Sherwood, J.N.

SPIE-The International Society for Optical Engineering

Niu, F., Dobson, P.J., Cantor, B.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12