COMPARISON OF THE BAND GAP OF POROUS SILICON AS MEASURED BY PHOTOELECTRON SPECTROSCOPY AND PHOTOLUMINESCENCE

COMPARISON OF THE BAND GAP OF POROUS SILICON AS MEASURED BY PHOTOELECTRON SPECTROSCOPY AND PHOTOLUMINESCENCE

Author(s):

Buuren, T. van

Publication title:

Microcrystalline and nanocrystalline semiconductors : Symposium held November 29-December 2, 1994, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

358

Pub. Year:

1995

Page(from):

441

Pub. info.:

Pittsburgh, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558992597 [1558992596]

Language:

English

Call no.:

M23500/358

Type:

Conference Proceedings

Details

TDL ID:	ZA00017983
Series ID:	PA00000011
Conf. info. (Name):	Symposium on microcrystalline and nanocrystalline semiconductors
Conf. info. (Number):	1994
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1994.11.29-1994.12.02

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