Anomalous interface degradation of a-Si:H TFTs during LCD lifetime

Anomalous interface degradation of a-Si:H TFTs during LCD lifetime

Author(s):

Libsch,F.R. ( IBM Thomas J.Watson Research Ctr. )
Tsujimura,T.

Publication title:

Active matrix liquid crystal displays technology and applications : 10-11 February, 1997, San Jose, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3014

Pub. Year:

1997

Page(from):

53

Page(to):

61

Pub. info.:

Bellingham, Washington: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819424259 [0819424250]

Language:

English

Call no.:

P63600/3014

Type:

Conference Proceedings

Details

TDL ID:	ZA00017976
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Active matrix liquid crystal displays technology and applications
Conf. info. (Number):	1997
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	1997.02.10-1997.02.11

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