Reliability of a 1550-nm MQW DFB high-power laser source
- Author(s):
- Evans,J.D. ( Nortel Technology )
- Davies,I.G.A.
- Goodwin,A.R.
- Yu,J.C.
- Janssen,A.P.
- Publication title:
- Fabrication, testing, and reliability of semiconductor lasers II : 13-14 February, 1997, San Jose, California
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3004
- Pub. Year:
- 1997
- Page(from):
- 104
- Page(to):
- 112
- Pub. info.:
- Bellingham, Washington: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819424150 [0819424153]
- Language:
- English
- Call no.:
- P63600/3004
- Type:
- Conference Proceedings
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