Electron escape dynamics from a biased quantum well

Electron escape dynamics from a biased quantum well

Author(s):

Lefebvre,K.R. ( Univ.of Connecticut )
Anwar,A.F.M.

Publication title:

Physics and Simulation of Optoelectronic Devices V

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2994

Pub. Year:

1997

Page(from):

442

Page(to):

451

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819424051 [0819424056]

Language:

English

Call no.:

P63600/2994

Type:

Conference Proceedings

Details

TDL ID:	ZA00017974
Series ID:	PA00000029
Conf. info. (Name):	Photonics West : Physics and Simulation of Optoelectronic Devices
Conf. info. (Number):	1997 : 5th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	1997.02.10-1997.02.14

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