Microcavity effects in an external-cavity surface-emitting laser
- Author(s):
- Sandusky,J.V. ( Univ.of New Mexico )
- Brueck,S.R.J.
- Publication title:
- Physics and Simulation of Optoelectronic Devices V
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 2994
- Pub. Year:
- 1997
- Page(from):
- 300
- Page(to):
- 308
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819424051 [0819424056]
- Language:
- English
- Call no.:
- P63600/2994
- Type:
- Conference Proceedings
Similar Items:
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
2
Conference Proceedings
Imaging interferometric lithography:extending optics to fundamental limits and beyond
SPIE - The International Society for Optical Engineering |
8
Conference Proceedings
Hybrid modelocking of external cavity with grating-coupled surface emitting laser
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
Epitaxial structure dependence of the linewidth enhancement factor in GaAs and InGaAs quantum well lasers
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
Experimental comparison of off-axis illumination and imaging interferometric lithography
SPIE - The International Society for Optical Engineering |
10
Conference Proceedings
Polarization selection in external-cavity birefringent vertical-cavity surface-emitting lasers
SPIE-The International Society for Optical Engineering |
5
Conference Proceedings
Spatial frequency analysis of optical lithography resolution enhancement techniques
SPIE - The International Society for Optical Engineering |
11
Conference Proceedings
Thermal poling and space charge dynamics including surface impurity injection in fused silica
SPIE - The International Society for Optical Engineering |
6
Conference Proceedings
Extension of 193-nm immersion optical lithography to the 22-nm half-pitch node
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |