Blank Cover Image

Distortion-invariant recognition approach

Author(s):
Publication title:
Optical Pattern Recognition VII
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2752
Pub. Year:
1996
Page(from):
338
Page(to):
345
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819421333 [0819421332]
Language:
English
Call no.:
P63600/2752
Type:
Conference Proceedings

Similar Items:

J. Li, B. He, G. Fu, C. Wang

SPIE - The International Society of Optical Engineering

Wang,D., Xie,W.

SPIE-The International Society for Optical Engineering

Liu,H., He,Q., Wu,M., Jin,G., Yan,Y.

SPIE - The International Society for Optical Engineering

J. Gao, X. Huang, G. Peng, M. Wong, X. Li

Society of Photo-optical Instrumentation Engineers

Liu,H., Wu,M., Jin,G., He,Q., Yan,Y.

SPIE - The International Society for Optical Engineering

M.E. Lhamon, L.G. Hassebrook, R.C. Daley

Society of Photo-optical Instrumentation Engineers

Liu,H., Wu,M., Jin,G., He,Q., Yan,Y.

SPIE - The International Society for Optical Engineering

Hong,R., Li,X., Hong,E., Wang,Z., Wei,H.

SPIE-The International Society for Optical Engineering

Liu,H., Wu,M., Jin,G., He,Q., Yan,Y.

SPIE - The International Society for Optical Engineering

Cruz V., Cristobal G., Michaux T., Barquin S.

Springer-Verlag

Javidi,B., Wang,W., Zhang,G.

SPIE-The International Society for Optical Engineering

Lee,S.H., Kim,J.W., Lee,H.W., Noh,D.S., Kim,S.J.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12