Discrete-time model to test links between EEG power and pupil diameter measured by infrared cameras

Discrete-time model to test links between EEG power and pupil diameter measured by infrared cameras

Author(s):

Keegan,A.P. ( Univ.of Illinois/Chicago )
Merritt,S.L.

Publication title:

Optical Engineering Midwest '95

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2622

Pub. Year:

1995

Vol.:

Part2

Page(from):

728

Page(to):

735

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819419866 [0819419869]

Language:

English

Call no.:

P63600/2622

Type:

Conference Proceedings

Details

TDL ID:	ZA00017937
Series ID:	PA00000029
Conf. info. (Name):	Optical Engineering Midwest
Conf. info. (Number):	1995
Conf. info. (Venue):	Chicago, IL, USA
Conf. info. (Date):	1995.05.18-1995.05.19

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