Blank Cover Image

A structure determination of the tilted α3 state of CO on Fe(001) by X-ray photoelectron diffraction

Author(s):
Publication title:
Structure and reactivity of surfaces : proceedings of a European conference, Trieste, Italy, September 13-16, 1988
Title of ser.:
Studies in surface science and catalysis
Ser. no.:
48
Pub. Year:
1989
Page(from):
723
Pub. info.:
Amsterdam: Elsevier
ISSN:
01672991
ISBN:
9780444874658 [0444874658]
Language:
English
Call no.:
S76950
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings X-ray Photoelectron Diffraction Measurements of Hexagonal GaN(0001) Thin Films

Denecke, R., Morais, J., Wetzel, C., Liesegang, J., Haller, E. E., Fadley, C. S.

MRS - Materials Research Society
7 Conference Proceedings MAGNETIC X-RAY CIRCULAR DICHROISM IN SPIN-POLARIZED PHOTOELECTRON DIFFRACTION

Waddill, G. D., Tobin, J. G., Guo, X., Tong, S. Y.

MRS - Materials Research Society
2 Conference Proceedings PHOTOELECTRON DIFFRACTION OF MAGNETIC ULTRATHIN FILMS: Fe/Cu(001)

Tobin, J.G., Wagner, M.K., Guo, X.-Q., Tong, S.Y.

Materials Research Society
8 Conference Proceedings Strain Relaxation in Ge/Si(001) Studied Using X-Ray Diffraction

Macdonald E. J., Williams A. A., van Silfhout R., van der Veen F. J., Finney S. M., Johnson D. A., Norris C.

Plenum Press
3 Conference Proceedings DIFFRACTION AND HOLOGRAPHY OF PHOTOELECTRONS AND FLUORESCENT X-RAYS

Fadley, Charles S.

MRS - Materials Research Society
9 Conference Proceedings Angle- and Temperature-Dependent Magnetic Circular Dichroism in Gd(0001) Core-Level Photoemission

Morais, J., Denecke, R., Yuzunza, R. X., Menchero, J. G., Liesegang, J., Fadley, C. S.

MRS - Materials Research Society
4 Conference Proceedings X-ray Photpelectron Diffraction Study of a High-Temperature Surface Phase Transition on Ge(111)

Tran T. T., Friedman J. D., Kim J. Y., Thevuthasan S., Herman S. G., Fadley S. C.

Plenum Press
10 Conference Proceedings GIANT MAGNETORESISTANCE OF (001)Fe/(001)Cr SUPERLATTICES

Barthelemy, A., Baibich, M.N., Broto, J.M., Cabanel, R., Creuzet, G., Etienne, P., Fert, A., Friederich, A., Lequien, …

Materials Research Society
5 Conference Proceedings CHARACTERIZATION OF GaAs/Si INTERFACE STRUCTURE BY X-RAY DIFFRACTION

Specht, E.D., Ice, G.E., Peters, C.J., Sparks, C.J., Lucas, N., Zhu, X.-M., Moret, R., Morkoc, H.

Materials Research Society
11 Conference Proceedings Strain and mosaic structure in Si0.7Ge0.3 epilayers grown on Si(001) substrates characterized by high resolution X-ray diffraction

Li, J. H., Moss, S. C.

MRS-Materials Research Society
6 Conference Proceedings Atomic Structure of Si-Rich 3C-SiC(001)-(3x2): a Photoelectron Diffraction Study

Tejeda, A., Michel, E.G., Dunham, D., Soukiassian, P., Denlinger, J.D., Rotenberg, E., Hurych, Z.D., Tonner, B.

Trans Tech Publications
12 Conference Proceedings DETERMINATION OF THE STATE OF DEFORMATION IN EPITAXIAL LAYERS USING HIGH RESOLUTION X-RAY DIFFRACTION

Dugdale, P. J., Pond, R. C., Barnett, S. J.

MRS - Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12