Performance and calibration of the AXAF High-Resolution Camera II: the spectroscopic detector

Performance and calibration of the AXAF High-Resolution Camera II: the spectroscopic detector

Author(s):

Kraft,R.P. ( Smithsonian Astrophysical Observatory )

Chappell,J.H. ( Smithsonian Astrophysical Observatory )

Kenter,A. T. ( Smithsonian Astrophysical Observatory )

Kobayashi,K. ( Smithsonian Astrophysical Observatory )

Meehan,G. R. ( Smithsonian Astrophysical Observatory )

Murray,S. S. ( Smithsonian Astrophysical Observatory )

Zombeck,M. V. ( Smithsonian Astrophysical Observatory )

Fraser,G. W. ( Univ.of Leicester (UK) )

Pearson,J. F. ( Univ.of Leicester (UK) )

Lees,J. E. ( Univ.of Leicester (UK) )

Brunton,A. N. ( Univ.of Leicester (UK) )

Barbera,M. ( Istitute e Osservatorio Astronomico G. S. Vaiana (Italy) )

Collura,A. ( Istitute e Osservatorio Astronomico G. S. Vaiana (Italy) )

Serio,S. ( Istitute e Osservatorio Astronomico G. S. Vaiana (Italy) )

9 more

Publication title:

EUV, X-ray, and gamma-ray instrumentation for astronomy VIII : 30 July - 1 August 1997, San Diego, California, Oswald H. W. Siegmund, Mark A. Gummin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3114

Pub. Year:

1997

Page(from):

53

Page(to):

73

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819425362 [0819425362]

Language:

English

Call no.:

P63600/3114

Type:

Conference Proceedings

Details

TDL ID:	ZA00017875
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : EUV,X-Ray, and Gamma-Ray Instrumentation for Astronomy
Conf. info. (Number):	1997 : 8th
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1997.07.01-1997.08.01

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