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X-ray diffraction analysis of crystallization of SbxSey thin films

Author(s):
Bao,H. ( Harbin Institute of Technology (China) )
Ye,S. ( Harbin Institute of Technology (China) )
Yuan,B. ( Harbin Institute of Technology (China) )
Lan,M. ( Harbin Institute of Technology (China) )
Zhou,S. ( Harbin Institute of Technology (China) )
Wang,Q. ( Harbin Institute of Technology (China) )
1 more
Publication title:
Optical thin films V : new developments : 30 July-1 August 1997, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3133
Pub. Year:
1997
Page(from):
140
Page(to):
146
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819425553 [0819425559]
Language:
English
Call no.:
P63600/3133
Type:
Conference Proceedings

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