Statistical analysis on the measuring resolution of edge position by digital imaging

Statistical analysis on the measuring resolution of edge position by digital imaging

Author(s):

Kim,S.-W. ( Korea Advanced Institute of Science and Technology )
Lee,S.Y. ( Korea Advanced Institute of Science and Technology )
Lee,J.K. ( Samsung Electronics (Korea) )

Publication title:

Ultrahigh- and High-Speed Photography and Image-based Motion Measurement

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3173

Pub. Year:

1997

Page(from):

306

Page(to):

316

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819425959 [0819425958]

Language:

English

Call no.:

P63600/3173

Type:

Conference Proceedings

Details

TDL ID:	ZA00017869
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Ultrahigh- and High-Speed Photography and Image-based Motion Measurement
Conf. info. (Number):	1997
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1997.07.28-1997.07.30

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