LAVA: lithography analysis using virtual access
- Author(s):
Hsu,C. ( Univ.of California/Berkeley ) Yang,R. ( Univ.of California/Berkeley ) Cheng,J. ( Univ.of California/Berkeley ) Chien,P. ( Univ.of California/Berkeley ) Wen,V. ( Univ.of California/Berkeley ) Neureuther,A.R. ( Univ.of California/Berkeley ) - Publication title:
- Optical microlithography XI : 25-27 February 1998, Santa Clara, California
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3334
- Pub. Year:
- 1998
- Page(from):
- 197
- Page(to):
- 201
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819427793 [0819427799]
- Language:
- English
- Call no.:
- P63600/3334
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
LAVA web-based remote simulation: enhancements for education and technology innovation
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
2
Conference Proceedings
Effects of residual aberrations on line-end shortening in 193-nm lithography
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
Improved performance of Apex-E photoresist with the application of the electric-field-enhanced PEB
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
10
Conference Proceedings
Implementation of double dipole lithography for 45-nm node poly and diffusion layer manufacturing with 0.93NA
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
12
Conference Proceedings
Enhanced quantitative analysis of resist image contrast upon line- edge roughness (LER)
SPIE-The International Society for Optical Engineering |