High-temperature single-hole silicon transistors
- Author(s):
Bagraev,N.T. ( A. F. loffe Physical Technical Institute (Russia) ) Gehlhoff,W. ( Technische Univ.Berlin (FRG) ) Klyachkin,L.E. ( A. F. loffe Physical Technical Institute (Russia) ) Malyarenko,A.M. ( A. F. loffe Physical Technical Institute (Russia) ) Naser,A. ( Technische Univ.Berlin (FRG) ) Romanov,V.V. ( St. Petersburg State Technical Univ.(Russia) ) - Publication title:
- International Workshop on New Approaches to High-Tech Materials, Nondestructive Testing and Computer Simulations in Materials Science and Engineering : 9-13 June 1997, St. Petersburg, Russia
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3345
- Pub. Year:
- 1998
- Page(from):
- 166
- Page(to):
- 174
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819427922 [0819427926]
- Language:
- English
- Call no.:
- P63600/3345
- Type:
- Conference Proceedings
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