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Threshold of laser-induced damage of transparent dielectrics with cracks

Author(s):
Publication title:
International Workshop on New Approaches to High-Tech Materials, Nondestructive Testing and Computer Simulations in Materials Science and Engineering : 9-13 June 1997, St. Petersburg, Russia
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3345
Pub. Year:
1998
Page(from):
51
Page(to):
54
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819427922 [0819427926]
Language:
English
Call no.:
P63600/3345
Type:
Conference Proceedings

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