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Optical studies of the internal electric field distributions,crystal defects,and detector performance of CdZnTe radiation detectors (Invited Paper)

Author(s):
Yao,H.W. ( Univ.of Nebraska/Lincoln and Sandia National Labs. )
James,R.B. ( Sandia National Labs. )
Lee,E.Y. ( Sandia National Labs. )
Olsen,R.W. ( Sandia National Labs. )
Hermon,H. ( Sandia National Labs. )
Anderson,R.J. ( Sandia National Labs. )
1 more
Publication title:
Hard X-ray and gamma-ray detector physics and applications : 22-23 July 1998, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3446
Pub. Year:
1998
Page(from):
169
Page(to):
178
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819429018 [0819429015]
Language:
English
Call no.:
P63600/3446
Type:
Conference Proceedings

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