Tenhunen D. J., Reynolds F. J., Lange L. O., Dougherty L. R., Harley C. P., Kummerow J., Rambal S.
Kluwer Academic Publishers
|
Foord S. J., Levoguer L. C., Davies J. G.
Kluwer Academic Publishers
|
Davies J. W., Rhizopoulou S., Sanderson R., Taylor G., Metcalfe C. J., Zhang Jianhua
Kluwer Academic Publishers
|
An, L., Wang, J., Liu, Y., Chen, T., Xu, S., Feng, H., Wang, X.
SPIE-The International Society for Optical Engineering
|
Briggs R. W., Mandoli F. D., Shinkle R. J., Kaufman S. L., WatsonC. J., thompson F. W.
Plenum Press
|
Davies W. J., Covey N. S., Donson J., Hull R., Maule J. A., Stanley J., Townsend R., Woolston J. C.
Plenum Press
|
Chappelle,E.W., Corp,L.A., McMurtrey,J.E., Kim,M.S., Daughtry,C.S.T.
SPIE-The International Society for Optical Engineering
|
Daniell, H., PoroboDessai, A., Prakash, C. S., Moar, W. J.
Springer-Verlag
|
Kwok M. W., Freemen C. L., Anumonwo J., Kass S. R.
Springer-Verlag
|
Was, G. S., Jones, J. W., Parfitt, L., Kalnas, C. E., Goldiner, M.
MRS - Materials Research Society
|
Van Gelder, C., Pranger, L.A., Urias, A. R., Lo, R., Wiesmann, W.P., Winchell, R.J., Kolka, M.A., Stachenfeld, N., …
SPIE-The International Society for Optical Engineering
|
Reese, John C.
American Chemical Society
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