De Valck D., Beyaert R., Van Roy F., Fiers W.
Plenum Press
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Santos,A., Ramiro,C., Desco,M., Malpica,N., Tejedor,A., Torres,A., Ledesma-Carbayo,M.J., Castilla,M., Garcia-Barreno,P.
SPIE-The International Society for Optical Engineering
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Driscoll E. K., Lindenschmidt C. R., Maurer K. J., Higgins M. J.
Springer-Verlag
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R. Goel, G. F. Paciotti, J. C. Bischof
Society of Photo-optical Instrumentation Engineers
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Klefstrom, J., Saksela, E., Alitalo, K.
Springer-Verlag
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David J. Klinke, Emily Chambers, Ning Cheng
American Institute of Chemical Engineers
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Haegeman G., Vandevoorde V., Fiers W.
Springer-Verlag
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Haegeman, G., Fiers, W.
Springer-Verlag
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Marmiroli, S., Bavelloni, A., Faenza, I., Sood, R., Santi, S., Cecchi, S., Maradli, N. M., Ognibene, A.
Springer-Verlag
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Brown M. G., Li Y. X., Donaldson K.
Plenum Press
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Borm P., Palmen N., Engelen J., Buurman W.
Springer-Verlag
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D. O. Lapotko, E. Y. Lukianova-Hleb, S. A. Zhdanok, J. H. Hafner, B. C. Rostro, P. Scully, M. Konopleva, M. Andreeff, C. …
SPIE - The International Society of Optical Engineering
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