Drews,D., Noell,W., Ehrfeld,W., Lacher,M., Mayr,K., Marti,O., Serwatzy,C., Abraham,M.
SPIE-The International Society for Optical Engineering
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Kirsch Achim, Meyer Christoph, Jovin M. Thomas
Plenum Press
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Kaupp,G., Herrmann,A., Wagenblast,G.
SPIE - The International Society for Optical Engineering
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Tamiya,E., Iwabuchi,S., Hashigasako,A., Murakami,Y., Sakaguchi,T., Morita,Y., Yokoyama,K.
SPIE - The International Society for Optical Engineering
|
Taylor,R.S., Leopold,K.E., Wendman,M.A., Gurley,G., Elings,V.
SPIE-The International Society for Optical Engineering
|
A. Jalocha, M.H.P. Moers, N.F. van Hulst
Society of Photo-optical Instrumentation Engineers
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Fujihira, M., Tani, Y., Furugori, M., Okabe, Y., Akiba, U., Yagi, K., Okamoto, S.
Elsevier
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Hartmann T., Gatz R., Wiegrabe W., Kramer A., Hillebrand A., Lieberman K., Baumeister W., Guckenberger R.
Kluwer Academic Publishers
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Fujihira M.
Kluwer Academic Publishers
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Ferber,J., Fischer,U.C., Koglin,J., Fuchs,H.
SPIE-The International Society for Optical Engineering
|
Pedarnig D. J., Specht M., Hansch W. T.
Kluwer Academic Publishers
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Tamiya,E., Iwabuchi,S., Murakami,Y., Sakaguchi,T., Yokoyama,K., Chiba,N., Muramatsu,H.
SPIE-The International Society for Optical Engineering
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