van de Ven M. J. Frank, van den Hooven W. Henno, Hilbers W. Cornelis, Konings H. N. Ruud
Springer-Verlag
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A. Friedrich, G. Habl, M. Sauer, J. Wolfrum, J. Hoheisel, N. Marme, J. Knemeyer
SPIE - The International Society of Optical Engineering
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Wijmenga, S. S., Heus, H. A., van de Ven, F. J. M., Hilbers, C. W.
Springer-Verlag
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Hosogi, M., Hashiguchi, G., Asao, F., Yamamoto, J., Goda, T., Hirano, K., Baba, Y., Kakushima, K., Fujifa, H.
SPIE - The International Society of Optical Engineering
|
Hilbers,C.W., Michiels,P.J.A., Heus,H.A.
IOS Press
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Zhou, Ning, Vogel, Hans J.
American Chemical Society
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Hilbers W. C., Wijmenga S. S., Hoppe H., Heus A. H.
Plenum Press
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Moore R. G., Cox C. M., Crowe D., Osborne J. M., Mauk G. A., Wilson T. M.
Kluwer Academic Publishers
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EI Amri, C.
ESA Publications Division
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Klug, C. A., Slichter, C. P., Sinfelt, J. H.
American Chemical Society
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Rusu,C.R., Oever,R.van't, Boer,M.J.de, Jansen,H.V., Berenschot,E., Elwenspoek,M.C., Bennink,M.L., Kanger,J.S., …
SPIE - The International Society for Optical Engineering
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Muramatsu,H., Kim,J.-M., Otani,T., Homma,K., Yoshida,M., Tate,S., Saito,M., Tamiya,E.
SPIE - The International Society for Optical Engineering
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