Techniques to inspect SCALPEL masks
- Author(s):
Taylor,D. ( Photronics,Inc ) Howard,W.B. Kasica,R.J. Farrow,R.C. Novembre,A.E. Caminos,C. Knurek,C.S. - Publication title:
- 19th Annual Symposium on Photomask Technology : 15-17 September 1999, Monterey, California
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3873
- Pub. Year:
- 1999
- Vol.:
- Part2
- Page(from):
- 858
- Page(to):
- 864
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780849434686 [084943468X]
- Language:
- English
- Call no.:
- P63600/3873
- Type:
- Conference Proceedings
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