Use of programmed multilayer defects in validating a defect compensation strategy for EUV Lithography
- Author(s):
Ray-Chaudhuri,A.K. ( Sandia National Labs. ) Cardinale,G.F. Fisher,A. Mangat,P.J.S. Liang,S. Sweeney,D.W. - Publication title:
- 19th Annual Symposium on Photomask Technology : 15-17 September 1999, Monterey, California
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3873
- Pub. Year:
- 1999
- Vol.:
- Part2
- Page(from):
- 838
- Page(to):
- 843
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780849434686 [084943468X]
- Language:
- English
- Call no.:
- P63600/3873
- Type:
- Conference Proceedings
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