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Analysis of interferometric fringe patterns by optical wavelet transform

Author(s):
Publication title:
Optical measurement systems for industrial inspection : 16-17 June 1999, Munich, Germany
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3824
Pub. Year:
1999
Page(from):
222
Page(to):
228
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819433107 [0819433101]
Language:
English
Call no.:
P63600/3824
Type:
Conference Proceedings

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