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X- and Y-ray tomography for nondestructive material testing

Author(s):
Cesareo,R. ( Univ.di Sassari )
Brunetti,A.
Lopes,R.T.
Galli,G.
Rao,D.V.
Castellano,A.
Gigante,G.E.
Mascarenhas,S.
Robert,R.
Filho,V.S.
Gilardoni,M.
Silva,H.P.Da
Colosso,P.Q.
8 more
Publication title:
Developments in X-ray tomography II : 22-23 July 1999, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3772
Pub. Year:
1999
Page(from):
292
Page(to):
303
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432582 [081943258X]
Language:
English
Call no.:
P63600/3772
Type:
Conference Proceedings

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