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New developments in attenuation and phase-contrast microtomography using synchrotron radiation with low and high photon energies

Author(s):
Publication title:
Developments in X-ray tomography II : 22-23 July 1999, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3772
Pub. Year:
1999
Page(from):
179
Page(to):
187
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432582 [081943258X]
Language:
English
Call no.:
P63600/3772
Type:
Conference Proceedings

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