Blank Cover Image

Practical comparison of phase diversity to interferometry in measuring the aberrations in an adaptive optics system

Author(s):
Publication title:
Adaptive optics systems and technology : 21-22 July 1999, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3762
Pub. Year:
1999
Page(from):
266
Page(to):
268
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432483 [0819432482]
Language:
English
Call no.:
P63600/3762
Type:
Conference Proceedings

Similar Items:

Macintosh,B.A., Olivier,S.S., Bauman,B.J., Brase,J.M., Carr,E., Carrano,C.J., Gavel,D.T., Max,C.E., Patience,J.

SPIE-The International Society for Optical Engineering

Awwal, A.A.S., Bauman, B.J., Gavel, D.T., Olivier, S.S., Jones, S., Silva, D.A., Hardy, J.L., Barnes, T.B., Werner, J.S.

SPIE - The International Society of Optical Engineering

Olivier,S.S., Gavel,D.T., Friedman,H.W., Max,C.E., An,J.R., Avicola,K., Bauman,B.J., Brase,J.M., Campbell,E.W., …

SPIE - The International Society for Optical Engineering

Bauman, B.J., Gavel, D.T.

SPIE-The International Society for Optical Engineering

Campbell,E.W., Bauman,B.J., Sweider,D.R., Olivier,S.S.

SPIE - The International Society for Optical Engineering

D.T. Gavel, S.S. Olivier

Society of Photo-optical Instrumentation Engineers

Gavel,D.T., Olivier,S.S., Bauman,B.J., Max,C.E., Macintosh,B.A.

SPIE - The International Society for Optical Engineering

Carrano, C.J., Olivier, S.S., Brase, J.M., Macintosh, B.A., An, J.R.

SPIE

Bauman,B.J., Gavel,D.T., Flath,L.M., Hurd,R.L., Max,C.E., Olivier,S.S.

SPIE-The International Society for Optical Engineering

Gavel, D.T., Gates, E.L., Max, C.E., Olivier, S.S., Bauman, B.J., Pennington, D.M., Macintosh,B.A., Patience, J., Brown, …

SPIE-The International Society for Optical Engineering

Bauman,B.J., Gavel,D.T., Waltjen,K.E., Freeze,G.J., Hurd,R.L., Gates,E.L., Max,C.E., Olivier,S.S., Pennington,D.M.

SPIE-The International Society for Optical Engineering

Bauman,B.J., Cavel,D.T., Waltjen,K.E., Freeze,G.J., Keahi,K.A., Kuklo,T.C., Lopes,S.K., Newman,M.J., Olivier,S.S.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12