Accurate measurement of the flatness of etalons

Accurate measurement of the flatness of etalons

Author(s):

Itoh,S. ( Tokyo Kogei Univ. )
Katoh,K.
Oikawa,T.
Chen,J.

Publication title:

Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3740

Pub. Year:

1999

Page(from):

606

Page(to):

609

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819432148 [0819432148]

Language:

English

Call no.:

P63600/3740

Type:

Conference Proceedings

Details

TDL ID:	ZA00017620
Series ID:	PA00000029
Conf. info. (Name):	Optical Engineering for Sensing and Nanotechnology : ICOSN '99
Conf. info. (Number):	1999
Conf. info. (Venue):	Yokohama, Japan
Conf. info. (Date):	1999.06.16-1999.06.18

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