Blank Cover Image

Thermo-optical characterization of a low-background infrared chamber and wideband infrared scene projector(WISP)array for hardware-in-the-loop testing

Author(s):
Publication title:
Technologies for synthetic environments : hardware-in-the-loop testing IV : 5-7 April 1999, Orlando, Florida
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3697
Pub. Year:
1999
Page(from):
274
Page(to):
285
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819431714 [0819431710]
Language:
English
Call no.:
P63600/3697
Type:
Conference Proceedings

Similar Items:

Flynn,D.S., Marlow,S.A., Bergin,T.P., Kircher,J.R.

SPIE - The International Society for Optical Engineering

7 Conference Proceedings Wideband infrared scene projector (WISP)

A.M. Carstens, R.G. Stockbridge, J.E. Dillon

Society of Photo-optical Instrumentation Engineers

Marlow,S.A., Flynn,D.S., Kircher,J.R.

SPIE-The International Society for Optical Engineering

L.E. Jones, E.M. Olson, J.R. Kircher, R.G. Stockbridge

Society of Photo-optical Instrumentation Engineers

Kircher,J.R., Marlow,S.A., Mackin,P.R.

SPIE-The International Society for Optical Engineering

Jones,L.E., Murrer,R.L.,Jr., Stockbridge,R.G., Timms,V.G., Guertin,A.W.

SPIE - The International Society for Optical Engineering

Cole,B.E., Higashi,R.E., Ridley,J.A., Holmen,J., Arendt,J., Malone,C.L., Stockbridge,R.G., II,G.C.Goldsmith, Jones,L.E.

SPIE-The International Society for Optical Engineering

Jones,L.E., Olson,E.M., Murrer,R.L.,Jr.

SPIE-The International Society for Optical Engineering

Kircher,J.R., Olson,E.M., Bergin,T.P., Flynn,D.S.

SPIE-The International Society for Optical Engineering

Kircher,J.R., Thompson,T., Cornell,M.C.

SPIE-The International Society for Optical Engineering

Tschiegg, D. R., Conard, J. S., Thompson, L. P., Carter, A.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12