Single-beam photothermal microscopy:a new diagnostic tool for optical materials

Single-beam photothermal microscopy:a new diagnostic tool for optical materials

Author(s):

Wu,Z.L. ( Lawrence Livermore National Lab. )

Publication title:

Laser-Induced Damage in Optical Materials: 1998

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3578

Pub. Year:

1999

Page(from):

604

Page(to):

613

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819430458 [0819430455]

Language:

English

Call no.:

P63600/3578

Type:

Conference Proceedings

Details

TDL ID:	ZA00017605
Series ID:	PA00000029
Conf. info. (Name):	Laser Damege : Laser-Induced Damage in Optical Materials
Conf. info. (Number):	1998
Conf. info. (Venue):	Boulder, CO, USA
Conf. info. (Date):	1998.09.28-1998.10.01

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