Blank Cover Image

Automated Response DOF Selection for Mapping of Experimental Normal Modes

Author(s):
Coppolino,R.N. ( Measurement Analysis Corporation )  
Publication title:
Proceedings of the 16th International Modal Analysis Conference February 2-5, 1998 Fess Parker's Doubletree Resort Santa Barbara, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3243
Pub. Year:
1998
Vol.:
Part1
Page(from):
70
Page(to):
76
Pub. info.:
Bethel, CT: Society for Experimental Mechanics
ISSN:
0277786X
ISBN:
9780912053592 [0912053593]
Language:
English
Call no.:
P63600/3243
Type:
Conference Proceedings

Similar Items:

Coppolino, R.N.

SPIE-The International Society for Optical Engineering

Couch, R.N., Chopra, I.

SPIE-The International Society for Optical Engineering

Coppolino, R.N.

SPIE-The International Society for Optical Engineering

8 Conference Proceedings UltraColor: a new gamut-mapping strategy

K.E. Spaulding, R.N. Ellson, J.R. Sullivan

Society of Photo-optical Instrumentation Engineers

Coppolino,R.N.

"Society of Automotive Engineering, Inc."

Pradhan,A., Panda,R.N., Nair,M.S., Laxmi,B.V., Agarwal,A., Rastogi,A.

SPIE - The International Society for Optical Engineering

Coppolino,R.N., Borowski,V.J.

Society for Experimental Mechanics

Coppolino, R. N., Adams, D. S., Levine, M. B.

SPIE - The International Society of Optical Engineering

Jacques,R.N.

SPIE-The International Society for Optical Engineering

Estep,R.N., Mitchell,L.D.

SPIE-The International Society for Optical Engineering

Hasselman,T.K., Coppolino,R.N., Zimmerman,D.C.

Society for Experimental Mechanics

Imamovic,N., Ewins,D.J.

Society for Experimental Mechanics

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12