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Test point selection using wavelet transforms for mixed-signal circuits

Author(s):
Publication title:
Wavelet Applications VII
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4056
Pub. Year:
2000
Page(from):
275
Page(to):
282
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436825 [0819436828]
Language:
English
Call no.:
P63600/4056
Type:
Conference Proceedings

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