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Demonstration of nanometer-level active metrology for long-range interferometric displacement measurements

Author(s):
Publication title:
Interferometry in optical astronomy : 27 - 29 March 2000 Munich, Germany
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4006
Pub. Year:
2000
Vol.:
Part2
Page(from):
838
Page(to):
846
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436313 [0819436313]
Language:
English
Call no.:
P63600/4006
Type:
Conference Proceedings

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