CHARACTERIZATION OF QUANTUM WELL STRUCTURES USING MICROSCOPE-SPECTROPHOTOMETRY

CHARACTERIZATION OF QUANTUM WELL STRUCTURES USING MICROSCOPE-SPECTROPHOTOMETRY

Author(s):

Publication title:

Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

324

Pub. Year:

1994

Page(from):

111

Pub. info.:

Pittsburgh: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558992238 [1558992235]

Language:

English

Call no.:

M23500/324

Type:

Conference Proceedings

Details

TDL ID:	ZA00017537
Series ID:	PA00000011
Conf. info. (Name):	Symposium on diagnostic techniques for semiconductor materials processing
Conf. info. (Number):	1993
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1993.11.29-1993.12.02

Similar Items:

1 Conference Proceedings CHARACTERIZATION OF ION BEAM SYNTHESIZED MATERIALS USING MICROSCOPE-SPECTROPHOTOMETRY Geatches, Rachel M., Reeson, Karen J., Criddle, Alan J., Finney, Mark S., Harry, Milton A., Webb, Roger P., Pearson, … MRS - Materials Research Society	7 Conference Proceedings Quantum Well Network Structures: Investigating Long-Range Thickness Fluctuations in Single InGaN/GaN Quantum Wells van der Laak, Nicole K., Oliver, Rachel A., Kappers, Menno J., Humphreys, Colin J. Materials Research Society
2 Conference Proceedings FABRICATION AND EVALUATION OF TERNARY Co-Fe-Si STRUCTURES PRODUCED BY ION BEAM SYNTHESIS Hunt, Tim D., Sealy, Brian J., Hanebeck, Jochen, Reeson, Karen J., Homewood, Kevin P., Gwilliam, Russell M., Douglas … Materials Research Society	8 Conference Proceedings (67c) Distribution Nucleation: Quantifying the Liquid Distribution On a Particles Surface Using the Dimensionless Particle Coating Number Ben Freireich, Waithira I. J. Kariuki, Rachel M. Smith, Martin Rhodes, Karen P. Hapgood American Institute of Chemical Engineers
3 Conference Proceedings CHARACTERIZATION OF PSEUDOMORPHIC Si/Si1-xGex MULTI-QUANTUM WELL STRUCTURES BY SPECTROSCOPIC ELLIPSOMETRY Carline, Roger T., Pickering, Christopher, Leong, Weng Y., Robbins, David J. MRS - Materials Research Society	9 Conference Proceedings Photoluminescence Characterization of SiGe/Si Quantum-Well Wire Structures Nilsson, S., Zeindl, H. P., Wolff, A., Pressel, K. MRS - Materials Research Society
4 Conference Proceedings DEPENDENCE OF SUBSTRATE ORIENTATION ON THE SYNTHESIS OF CoSi2 LAYERS FORMED BY ION IMPLANTATION & RAPID THERMAL ANNEALING Gwilliam, Russell M., Raeson, Karen J., Webb, Roger P., Spraggs, Russells S., Sealy, Brian J. Materials Research Society	10 Conference Proceedings Molecular Beam Epitaxial Growth of AlN/GaN Multiple Quantum Wells Wu, Hong, Schaff, William J., Koley, Goutam, Furis, Madalina, Cartwright, A.N., Mkhoyan, Karen A., Silcox, John, … Materials Research Society
5 Conference Proceedings CHARACTERIZATION OF QUANTUM WELLS BY AUGER ANALYSIS ON CHEMICAL BEVELS Olivier, J., Etienne, P, Razeghi, M., Alnot, P. Materials Research Society	11 Conference Proceedings Gain characteristics of GaInP quantum well laser structures (Invited Paper) Lewis, G.M., Thomson, P.D., Smowton, P.M., Hulyer, P.J., Blood, P. SPIE-The International Society for Optical Engineering
6 Conference Proceedings Evaluation procedure for nonintrusive exhaust gas analysis of jet engines using FTIR spectroscopy Lindermeir,E., Haschberger,P., Geatches,R.M. SPIE - The International Society for Optical Engineering	12 Conference Proceedings Modeling and characterization of colliding pulse mode-locked(CPM)quantum well lasers Bischoff,S., Brorson,S.D., Franck,T., Hofmann,M., Prip,L., Sorensen,M.P., Mork,J. SPIE-The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12