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Reliability of Cu/WN Thin Films Deposited on Low-Dielectric Constant SiOF ILD

Author(s):
Lee, Seoghyeong
Kim, Dong Joon
Yang, Sung-Hoon
Park, Jeongwon
Sohn, Seil
Oh, Kyunghui
Kim, Yong-Tae
Park, Jong-Wan
3 more
Publication title:
Low-dielectric constant materials IV : symposium held April 14-16, 1998, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
511
Pub. Year:
1998
Page(from):
347
Pub. info.:
Warrendale, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994171 [1558994173]
Language:
English
Call no.:
M23500/511
Type:
Conference Proceedings

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